DocumentCode :
3567685
Title :
ESD risk evaluation of automatic semiconductor process equipment — A new guideline of the German ESD Forum e.V.
Author :
Jacob, Ponnu ; Gartner, Richard ; Gieser, H. ; Helling, K. ; Pfeifle, R. ; Thiemann, U. ; Wulfert, F. ; Rothkirch, W.
Author_Institution :
Dept. 173 Electron./ Metrol., Empa Dubendorf, Dubendorf, Switzerland
fYear :
2012
Firstpage :
1
Lastpage :
10
Abstract :
While existing standards and guidelines mainly deal with standard requirements for EPAs and ESD-protected workplaces, only few recommendations exist for machines. Increasing ESD-requirements of new semiconductor products requested to provide useful information for machine manufacturers and ESD coordinators as well. The German ESD Forum e.V. developed new guidelines based on practical experience of experts and theoretical considerations on charging and discharging mechanisms as well.
Keywords :
electrostatic discharge; risk analysis; semiconductor technology; EPA; ESD coordinators; ESD protected area; ESD risk evaluation; German ESD forum e.V; automatic semiconductor process equipment; semiconductor products; Capacitance; Discharges (electric); Electrostatic discharges; Guidelines; Metals; Surface discharges; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
ISSN :
0739-5159
Print_ISBN :
978-1-4673-1467-1
Type :
conf
Filename :
6333308
Link To Document :
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