DocumentCode
3567773
Title
III-V nanowire MOSFETs
Author
Wernersson, Lars-Erik
Author_Institution
Electrical and Information Technology, Lund University, Sweden
fYear
2014
Abstract
III-V MOSFETs are currently attracting considerable attention due the advantageous transport properties of the III-V materials. The recent development includes realization of transistors with transconductance values that are comparable or higher than state-of-the-art III-V HEMTs. Low on-resistance has further been achieved by the use of epitaxial regrowth technologies. However, to maintain electrostatic integrity as the gate length is scaled, the transistor evolution suggests the introduction of non-planar geometries, following the development of the Si technology. In this talk, we will review the current status of the III-V MOSFET evolution with a special emphasis on the III-V nanowire MOSFETs fabricated in lateral or vertical geometry.
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International
Print_ISBN
978-1-4799-7308-8
Type
conf
DOI
10.1109/IIRW.2014.7049539
Filename
7049539
Link To Document