• DocumentCode
    3567773
  • Title

    III-V nanowire MOSFETs

  • Author

    Wernersson, Lars-Erik

  • Author_Institution
    Electrical and Information Technology, Lund University, Sweden
  • fYear
    2014
  • Abstract
    III-V MOSFETs are currently attracting considerable attention due the advantageous transport properties of the III-V materials. The recent development includes realization of transistors with transconductance values that are comparable or higher than state-of-the-art III-V HEMTs. Low on-resistance has further been achieved by the use of epitaxial regrowth technologies. However, to maintain electrostatic integrity as the gate length is scaled, the transistor evolution suggests the introduction of non-planar geometries, following the development of the Si technology. In this talk, we will review the current status of the III-V MOSFET evolution with a special emphasis on the III-V nanowire MOSFETs fabricated in lateral or vertical geometry.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International
  • Print_ISBN
    978-1-4799-7308-8
  • Type

    conf

  • DOI
    10.1109/IIRW.2014.7049539
  • Filename
    7049539