• DocumentCode
    3567781
  • Title

    Special interest group II: Consumer electronics into Harsh environment electronics: Semiconductor reliability challenges, research needs and started activities

  • Author

    Aal, Andreas

  • Author_Institution
    Volkswagen AG, Electronic Analysis / Robustness (EEIP/1), Berliner Ring 2, 38436 Wolfsburg, Germany
  • fYear
    2014
  • Firstpage
    177
  • Lastpage
    178
  • Abstract
    The topic of this special interest group has its roots in two general segments.
  • Keywords
    Automotive engineering; Data models; Foundries; Industries; Qualifications; Reliability; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International
  • Print_ISBN
    978-1-4799-7308-8
  • Type

    conf

  • DOI
    10.1109/IIRW.2014.7049547
  • Filename
    7049547
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3567781