Title :
Characterization of Multiconductor Coupled Lines from Multiport TDR Measurements
Author :
Tripathi, Alok ; Tripathi, V.K.
Author_Institution :
Department of Electrical & Computer Engineering, Oregon State University, Corvallis, OR 97331-3211
fDate :
6/1/1997 12:00:00 AM
Abstract :
A new procedure to characterize nonuniform coupled multiconductor lines based on one dimensional peeling algorithm is presented. The measured multiport reflection (scattering parameter) parameters in time domain are used to construct piece-wise uniform configuration oriented models for multiple coupled lines. Examples of nonuniform two and three coupled striplines are included to illustrate the technique.
Keywords :
Admittance; Coupling circuits; Data mining; Electric variables measurement; Integrated circuit interconnections; Matrix decomposition; Reflection; Time measurement; Transmission line matrix methods; Voltage;
Conference_Titel :
ARFTG Conference Digest-Spring, 49th
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1997.327234
