DocumentCode
3567845
Title
Characterization of Multiconductor Coupled Lines from Multiport TDR Measurements
Author
Tripathi, Alok ; Tripathi, V.K.
Author_Institution
Department of Electrical & Computer Engineering, Oregon State University, Corvallis, OR 97331-3211
Volume
31
fYear
1997
fDate
6/1/1997 12:00:00 AM
Firstpage
231
Lastpage
235
Abstract
A new procedure to characterize nonuniform coupled multiconductor lines based on one dimensional peeling algorithm is presented. The measured multiport reflection (scattering parameter) parameters in time domain are used to construct piece-wise uniform configuration oriented models for multiple coupled lines. Examples of nonuniform two and three coupled striplines are included to illustrate the technique.
Keywords
Admittance; Coupling circuits; Data mining; Electric variables measurement; Integrated circuit interconnections; Matrix decomposition; Reflection; Time measurement; Transmission line matrix methods; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 49th
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1997.327234
Filename
4119919
Link To Document