مرکز منطقه ای اطلاع رساني علوم و فناوري - Clock Distribution Design In VLSI Circuits

DocumentCode :

3568037

Title :

Clock Distribution Design In VLSI Circuits - an Overview

Author :

Friedman, Eby G.

Author_Institution :

University of Rochester

fYear :

1993

Firstpage :

1475

Lastpage :

1478

Keywords :

Circuit testing; Clocks; Counting circuits; Delay; Latches; Logic; System testing; Timing; USA Councils; Very large scale integration;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on

Print_ISBN :

0-7803-1281-3

Type :

conf

Filename :

692936

Link To Document :