DocumentCode

3568439

Title

Functional Testing And Constrained Synthesis Of Sequential Architectures

Author

Buonanno, G. ; Fummi, F. ; Sciuto, Donatella

Author_Institution

Politecnico di Milano

fYear

1993

Firstpage

1523

Lastpage

1526

Keywords

Automata; Benchmark testing; Concatenated codes; Constraint optimization; Sequential analysis; Tail; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on

Print_ISBN

0-7803-1281-3

Type

conf

Filename

692948