Title :
All-digital 0.016mm2 reconfigurable sensor-ADC using 4CKES-TAD in 65nm digital CMOS
Author :
Watanabe, Takamoto ; Yu Hou ; Miyahara, Masaya ; Matsuzawa, Akira
Author_Institution :
DENSO Corp., Kariya, Japan
Abstract :
An all-digital reconfigurable (10-to-16-bit) sensor ADC based on TAD (Time A/D converter) is completely digital, using a ring-delay-line RDL driven by an input voltage Vin as its power supply. This method realized 16.2bit/100ksps/37.5nW from 0.6V supply without any static current using a 0.016mm2 prototype 4CKES (4-clock-edge-shift) TAD in a 65nm digital CMOS. Resolutions can be controlled by setting its conversion time Tcv A 13.8bit/1Msps/75.4μW or 10.5bit/10Msps/93.2μW operation is also experimentally confirmed using 0.6V supply. Finally, correction of nonlinearity characteristics has been discussed using differential-setup processing method.
Keywords :
CMOS digital integrated circuits; delay lines; rings (structures); sensors; time-digital conversion; 4-clock-edge-shift-time analog-digital converter; 4CKES-TAD; RDL; all-digital reconfigurable sensor-ADC; conversion time; differential-setup processing method; digital CMOS; nonlinearity characteristics; power 37.5 muW; power 75.4 muW; power 93.2 muW; power supply; resolution control; ring-delay-line; size 65 nm; static current; voltage 0.6 V; word length 10.5 bit; word length 13.8 bit; word length 16.2 bit; CMOS integrated circuits; Clocks; Delays; Digital circuits; Latches; Noise;
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2014 21st IEEE International Conference on
DOI :
10.1109/ICECS.2014.7049911
