DocumentCode
3568626
Title
Extended event-driven modeling of a ΣΔ-fractional-N PLL including non-ideal effects
Author
Hangmann, Christian ; Hedayat, Christian ; Hilleringmann, Ulrich
Author_Institution
Sensor Technol. Group, Univ. of Paderborn, Paderborn, Germany
fYear
2014
Firstpage
100
Lastpage
103
Abstract
In modern systems PLLs are widely used e.g. for frequency synthesis. Since this feedback control system exhibits a mixed-signal nature, it is challenging to use general theory to characterize its dynamic behavior. Additionally, due to the low and high frequency parts, simulations utilizing either a behavioral or transistor-level model are not computer resource efficient. To overcome this the modular and enhanced Event-Driven Model can be used. Since the existing Event-Driven Model is neither applicable to take different divider delays into account nor to consider a ΣΔ-Modulator, this work focuses on the extension of this modeling approach considering a ΣΔ-Fractional-N PLL with non-ideal effects like dead zone, leakage current and different divider delays. This extended model is validated with transistor-level simulations and is used to explore the impact of non-ideal effects on the loop characteristics.
Keywords
phase locked loops; sigma-delta modulation; ΣΔ-fractional-N PLL; ΣΔ-modulator; dead zone; divider delays; extended event-driven modeling; feedback control system; frequency synthesis; leakage current; mixed-signal nature; transistor-level model; transistor-level simulations; Computational modeling; Delays; Frequency synthesizers; Leakage currents; Phase frequency detector; Phase locked loops; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems (ICECS), 2014 21st IEEE International Conference on
Type
conf
DOI
10.1109/ICECS.2014.7049931
Filename
7049931
Link To Document