• DocumentCode
    3568626
  • Title

    Extended event-driven modeling of a ΣΔ-fractional-N PLL including non-ideal effects

  • Author

    Hangmann, Christian ; Hedayat, Christian ; Hilleringmann, Ulrich

  • Author_Institution
    Sensor Technol. Group, Univ. of Paderborn, Paderborn, Germany
  • fYear
    2014
  • Firstpage
    100
  • Lastpage
    103
  • Abstract
    In modern systems PLLs are widely used e.g. for frequency synthesis. Since this feedback control system exhibits a mixed-signal nature, it is challenging to use general theory to characterize its dynamic behavior. Additionally, due to the low and high frequency parts, simulations utilizing either a behavioral or transistor-level model are not computer resource efficient. To overcome this the modular and enhanced Event-Driven Model can be used. Since the existing Event-Driven Model is neither applicable to take different divider delays into account nor to consider a ΣΔ-Modulator, this work focuses on the extension of this modeling approach considering a ΣΔ-Fractional-N PLL with non-ideal effects like dead zone, leakage current and different divider delays. This extended model is validated with transistor-level simulations and is used to explore the impact of non-ideal effects on the loop characteristics.
  • Keywords
    phase locked loops; sigma-delta modulation; ΣΔ-fractional-N PLL; ΣΔ-modulator; dead zone; divider delays; extended event-driven modeling; feedback control system; frequency synthesis; leakage current; mixed-signal nature; transistor-level model; transistor-level simulations; Computational modeling; Delays; Frequency synthesizers; Leakage currents; Phase frequency detector; Phase locked loops; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems (ICECS), 2014 21st IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/ICECS.2014.7049931
  • Filename
    7049931