Title :
Analysis and performance trade-offs of linearity calibration for stochastic ADCs
Author :
Waters, Allen ; Leuenberger, Spencer ; Farahbakhshian, Farshad ; Un-Ku Moon
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
Abstract :
Stochastic flash analog-to-digital converters (ADCs) have been proposed as a solution to the scalability problems encountered by a standard flash ADC. Instead of generating comparator references with a well-matched resistor ladder, it generates randomly distributed thresholds using either the comparator offsets or a separate noise-generating circuit. This allows all devices to be minimum size without matching problems; consequently the stochastic ADC becomes an attractive solution for a synthesizable ADC design. This work achieves two goals: first, it derives the relationship between the number of comparator decisions and effective resolution of a stochastic ADC with an arbitrary probability distribution function (PDF) of comparator thresholds. Second, this work identifies the conditions under which linearity calibration will improve performance. Monte-Carlo simulations demonstrate that for high signal amplitude or numbers of comparisons, calibration significantly improves resolution. For low amplitudes or numbers of comparisons, the ADC performs better without linearity calibration.
Keywords :
Monte Carlo methods; analogue-digital conversion; calibration; comparators (circuits); integrated circuit design; performance evaluation; random processes; statistical distributions; stochastic processes; Monte Carlo simulation; PDF; comparator offsets; comparator thresholds; linearity calibration; noise-generating circuit; performance improvement; probability distribution function; randomly distributed threshold generation; scalability problems; stochastic ADC; stochastic flash analog-to-digital converters; synthesizable ADC design; Calibration; Linearity; Monte Carlo methods; Noise; Nonlinear distortion; Quantization (signal); Signal resolution;
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2014 21st IEEE International Conference on
DOI :
10.1109/ICECS.2014.7049958