DocumentCode :
3568768
Title :
Hole analysis for functional coverage data
Author :
Lachish, Oded ; Marcus, Eitan ; Ur, Shmuel ; Ziv, Avi
Author_Institution :
IBM Israel Sci. & Technol. Center, Haifa, Israel
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
807
Lastpage :
812
Abstract :
One of the main goals of coverage tools is to provide the user with informative presentation of coverage information. Specifically, information on large, cohesive sets of uncovered tasks with common properties is very useful. This paper describes methods for discovering and reporting large uncovered spaces (holes) for crossproduct functional coverage models. Hole analysis is a presentation method for coverage data that is both succinct and informative. Using case studies, we show how hole analysis was used to detect large uncovered spaces and improve the quality of verification.
Keywords :
circuit CAD; circuit analysis computing; formal verification; logic CAD; logic testing; cross-product functional coverage models; functional coverage data; functional verification; hole analysis; large uncovered spaces; logic design; presentation method; processor design; test coverage analysis; verification quality improvement; Algorithm design and analysis; Laboratories; Logic design; Logic testing; Permission; Read-write memory; Software debugging; Software engineering; Software testing; Software tools;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2002. Proceedings. 39th
ISSN :
0738-100X
Print_ISBN :
1-58113-461-4
Type :
conf
DOI :
10.1109/DAC.2002.1012733
Filename :
1012733
Link To Document :
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