DocumentCode
3568768
Title
Hole analysis for functional coverage data
Author
Lachish, Oded ; Marcus, Eitan ; Ur, Shmuel ; Ziv, Avi
Author_Institution
IBM Israel Sci. & Technol. Center, Haifa, Israel
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
807
Lastpage
812
Abstract
One of the main goals of coverage tools is to provide the user with informative presentation of coverage information. Specifically, information on large, cohesive sets of uncovered tasks with common properties is very useful. This paper describes methods for discovering and reporting large uncovered spaces (holes) for crossproduct functional coverage models. Hole analysis is a presentation method for coverage data that is both succinct and informative. Using case studies, we show how hole analysis was used to detect large uncovered spaces and improve the quality of verification.
Keywords
circuit CAD; circuit analysis computing; formal verification; logic CAD; logic testing; cross-product functional coverage models; functional coverage data; functional verification; hole analysis; large uncovered spaces; logic design; presentation method; processor design; test coverage analysis; verification quality improvement; Algorithm design and analysis; Laboratories; Logic design; Logic testing; Permission; Read-write memory; Software debugging; Software engineering; Software testing; Software tools;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2002. Proceedings. 39th
ISSN
0738-100X
Print_ISBN
1-58113-461-4
Type
conf
DOI
10.1109/DAC.2002.1012733
Filename
1012733
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