DocumentCode :
3568809
Title :
Progress in multi-element silicon detectors for synchrotron XRF applications
Author :
Ludewigt, B. ; Rossington, C. ; Kipnis, I. ; Krieger, B.
Author_Institution :
Lawrence Berkeley Nat. Lab., CA, USA
Volume :
1
fYear :
1995
Firstpage :
584
Abstract :
Multi-element silicon strip detectors, in conjunction with integrated circuit pulse-processing electronics, offer an attractive alternative to conventional lithium-drifted silicon and high purity germanium detectors for high count rate, low noise synchrotron X-ray fluorescence applications. We have been developing these types of detectors specifically for low noise synchrotron applications, such as extended X-ray absorption fine structure spectroscopy, microprobe X-ray fluorescence and total reflection X-ray fluorescence. The current version of the 192-element detector and integrated circuit preamplifier, cooled to -25°C with a single-stage thermoelectric cooler, achieves an energy resolution of <200 eV full width of half maximum (FWHM) per channel (at 5.9 keV, 2 μs peaking time), and each detector element is designed to handle ~20 kHz count rate. The detector system will soon be completed to 64 channels using new application specific integrated circuit amplifier chips, new CAMAC analog-to-digital converters recently developed at Lawrence Berkeley National Laboratory, CAMAC histogramming modules, and Macintosh-based data acquisition software. We report on the characteristics of this detector system, and the work in progress towards the next generation system
Keywords :
CAMAC; X-ray detection; X-ray fluorescence analysis; X-ray spectrometers; analogue-digital conversion; application specific integrated circuits; detector circuits; nuclear electronics; preamplifiers; silicon radiation detectors; 2 mus; 25 degC; 5.9 keV; ADC; ASIC; CAMAC histogramming modules; EXAFS; Si; amplifier chips; analog-to-digital converters; application specific integrated circuit; count rate; data acquisition software; energy resolution; extended X-ray absorption fine structure spectroscopy; integrated circuit preamplifier; microprobe X-ray fluorescence; multi-element Si strip detectors; peaking time; synchrotron X-ray fluorescence; synchrotron XRF appl.; thermoelectric cooler; total reflection X-ray fluorescence; Application specific integrated circuits; CAMAC; Fluorescence; Integrated circuit noise; Pulse circuits; Silicon; Strips; Synchrotrons; X-ray detection; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Print_ISBN :
0-7803-3180-X
Type :
conf
DOI :
10.1109/NSSMIC.1995.504328
Filename :
504328
Link To Document :
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