DocumentCode
3568968
Title
An LUT-based error diagnosis technique improved in multiplicity of rectifiable errors
Author
Sugane, Toshifumi ; Iida, Takayuki ; Inoue, Hiroshi ; Kuroki, Nobutaka ; Numa, Masahiro ; Yamamoto, Keisuke
Author_Institution
Graduate Sch. of Sci. & Technol., Kobe Univ., Japan
Volume
1
fYear
2004
Abstract
In an LSI design process, engineering change orders (ECO´s) are often given due to logic design errors, changes of specification, and timing issue. This paper presents an improved technique called EXLIT to rectify multiple logic design errors using LUT-based circuit model, which is needed to rectify errors with compound cells often used in standard-cell design. In contrast to the conventional technique: EXLTV applicable only to four errors at the maximum, EXLIT rectifies ten errors by employing iterative diagnosis procedure for subcircuits extracted based on the correctness of primary output functions. By handling the subcircuits, EXLIT reduces both the number of LUT´s and the number of errors to be considered at once. Experimental results demonstrate that most of circuits including eight to ten design errors can be rectified within shorter processing time.
Keywords
error analysis; iterative methods; logic circuits; logic design; table lookup; EXLIT algorithm; error diagnosis; extended X-algorithm; iterative diagnosis procedure; lookup table; multiple logic design errors; Binary decision diagrams; Boolean functions; Circuit synthesis; Design engineering; Error correction; Large scale integration; Logic circuits; Logic design; Process design; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2004. MWSCAS '04. The 2004 47th Midwest Symposium on
Print_ISBN
0-7803-8346-X
Type
conf
DOI
10.1109/MWSCAS.2004.1354043
Filename
1354043
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