• DocumentCode
    3568968
  • Title

    An LUT-based error diagnosis technique improved in multiplicity of rectifiable errors

  • Author

    Sugane, Toshifumi ; Iida, Takayuki ; Inoue, Hiroshi ; Kuroki, Nobutaka ; Numa, Masahiro ; Yamamoto, Keisuke

  • Author_Institution
    Graduate Sch. of Sci. & Technol., Kobe Univ., Japan
  • Volume
    1
  • fYear
    2004
  • Abstract
    In an LSI design process, engineering change orders (ECO´s) are often given due to logic design errors, changes of specification, and timing issue. This paper presents an improved technique called EXLIT to rectify multiple logic design errors using LUT-based circuit model, which is needed to rectify errors with compound cells often used in standard-cell design. In contrast to the conventional technique: EXLTV applicable only to four errors at the maximum, EXLIT rectifies ten errors by employing iterative diagnosis procedure for subcircuits extracted based on the correctness of primary output functions. By handling the subcircuits, EXLIT reduces both the number of LUT´s and the number of errors to be considered at once. Experimental results demonstrate that most of circuits including eight to ten design errors can be rectified within shorter processing time.
  • Keywords
    error analysis; iterative methods; logic circuits; logic design; table lookup; EXLIT algorithm; error diagnosis; extended X-algorithm; iterative diagnosis procedure; lookup table; multiple logic design errors; Binary decision diagrams; Boolean functions; Circuit synthesis; Design engineering; Error correction; Large scale integration; Logic circuits; Logic design; Process design; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2004. MWSCAS '04. The 2004 47th Midwest Symposium on
  • Print_ISBN
    0-7803-8346-X
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2004.1354043
  • Filename
    1354043