DocumentCode :
3568968
Title :
An LUT-based error diagnosis technique improved in multiplicity of rectifiable errors
Author :
Sugane, Toshifumi ; Iida, Takayuki ; Inoue, Hiroshi ; Kuroki, Nobutaka ; Numa, Masahiro ; Yamamoto, Keisuke
Author_Institution :
Graduate Sch. of Sci. & Technol., Kobe Univ., Japan
Volume :
1
fYear :
2004
Abstract :
In an LSI design process, engineering change orders (ECO´s) are often given due to logic design errors, changes of specification, and timing issue. This paper presents an improved technique called EXLIT to rectify multiple logic design errors using LUT-based circuit model, which is needed to rectify errors with compound cells often used in standard-cell design. In contrast to the conventional technique: EXLTV applicable only to four errors at the maximum, EXLIT rectifies ten errors by employing iterative diagnosis procedure for subcircuits extracted based on the correctness of primary output functions. By handling the subcircuits, EXLIT reduces both the number of LUT´s and the number of errors to be considered at once. Experimental results demonstrate that most of circuits including eight to ten design errors can be rectified within shorter processing time.
Keywords :
error analysis; iterative methods; logic circuits; logic design; table lookup; EXLIT algorithm; error diagnosis; extended X-algorithm; iterative diagnosis procedure; lookup table; multiple logic design errors; Binary decision diagrams; Boolean functions; Circuit synthesis; Design engineering; Error correction; Large scale integration; Logic circuits; Logic design; Process design; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2004. MWSCAS '04. The 2004 47th Midwest Symposium on
Print_ISBN :
0-7803-8346-X
Type :
conf
DOI :
10.1109/MWSCAS.2004.1354043
Filename :
1354043
Link To Document :
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