Title :
A 10-bit, 3 ps rms precision time-to-digital converter for diffuse optical tomography measurements
Author :
Kanoun, Moez ; Arpin, Louis ; Rheaume, Vincent-Philippe ; Tetreault, Marc-Andre ; Berube-Lauziere, Yves ; Fontaine, Rejean
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. de Sherbrooke, Sherbrooke, QC, Canada
Abstract :
This paper reports the design of a 10-bit time-to-digital converter (TDC) based on Vernier residues amplification dedicated to diffuse optical tomography (DOT) measurements. The key benefits of the proposed architecture is to keep a low jitter, hence delivering high TDC precision, and allowing reaching high resolution regardless of the process technology. Experimental results show that the TDC achieves a timing resolution of 12.3 ps and a precision of 3 ps rms in a 12.5 ns window. Moreover, the TDC shows differential and integral nonlinearities (DNL and INL) of 0.39 and 1.35 LSB rms respectively. The TDC, implemented in 130 nm CMOS technology, occupies a total silicon area of 1.83 × 2.23 mm2 including interconnect pads and consumes 4.8 mW excluding the digital I/O. Such TDC can find useful applications in biomedicai imaging systems and in all-digital phase-locked loop (D-PLL).
Keywords :
CMOS integrated circuits; biomedical electronics; biomedical optical imaging; digital phase locked loops; integrated circuit interconnections; optical tomography; time-digital conversion; CMOS technology; D-PLL; DNL; DOT measurements; INL; TDC precision; Vernier residues amplification; all-digital phase-locked loop; biomedical imaging systems; differential nonlinearities; diffuse optical tomography measurements; integral nonlinearities; interconnect pads; power 4.8 mW; size 1.83 mm; size 130 nm; size 2.23 mm; time 12.3 ps; time 12.5 ns; time 3 ps; time-to-digital converter; Biomedical measurement; Delays; Dynamic range; Multiplexing; Optical variables measurement; Quantization (signal); CMOS Time-to-Digital converters; Diffuse optical Tomography; Time-of-flight measurement;
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2014 21st IEEE International Conference on
DOI :
10.1109/ICECS.2014.7050045