DocumentCode :
3569043
Title :
Electrical properties of polymer nano-composites based on oxide and nitride fillers
Author :
Hosier, I.L. ; Praeger, M. ; Vaughan, A.S. ; Swingler, S.G.
Author_Institution :
Tony Davis High Voltage Lab., Univ. of Southampton, Southampton, UK
fYear :
2015
Firstpage :
438
Lastpage :
441
Abstract :
Four polyethylene based nano-composites containing either silica or silicon nitride were prepared. After verifying their compositions and morphologies, their dielectric properties were followed as a function of conditioning (absorbed water content). The dielectric loss and DC breakdown strength were found to be strongly dependent on conditioning whilst the properties of a control sample (with no nano-filler) were found to be invariant. Under ambient conditions, silicon nitride provides a composite with reduced dielectric loss and increased breakdown strength compared to an analogous system employing silica. Silicon nitride based systems exhibit improved breakdown strength relative to the host polymer when dried and therefore hold significant potential for use in future HVDC cables.
Keywords :
conducting polymers; dielectric losses; drying; electric breakdown; filled polymers; nanocomposites; nanofabrication; silicon compounds; DC breakdown strength; HVDC cables; SiN; SiO2; analogous system; dielectric loss; drying; electrical properties; morphology; nitride fillers; oxide fillers; polyethylene based nanocomposites; silica; silicon nitride based systems; Electric breakdown; Silicon compounds; DC breakdown strength; Nano-composites; dielectric loss; water absorption;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation Conference (EIC), 2015 IEEE
Print_ISBN :
978-1-4799-7352-1
Type :
conf
DOI :
10.1109/ICACACT.2014.7223515
Filename :
7223515
Link To Document :
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