• DocumentCode
    356913
  • Title

    Design of dual use, high efficiency, 4H-SiC Schottky and MPS diodes

  • Author

    Severt, Clarence ; Agarwal, A. ; Singh, R. ; Ryu, Sang Hyun ; Palmour, J.W.

  • Author_Institution
    Power Div., Air Force Res. Lab., Wright-Patterson AFB, OH, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    180
  • Abstract
    The prime benefit of the SiC Schottky diode lies in its ability to switch fast (<50 ns) and with almost no reverse recovery charge. The incorporation of a SiC Schottky-type rectifier in typical power-electronic systems, such as motor drive circuits and switching power supplies, will virtually eliminate the switching losses. In the forward bias, Ti Schottky diode provides a forward current density of 100 A/cm2 at a forward drop of 1.15 V, at room temperature. However, the low barrier height of Ti Schottky diode results in a very high room temperature leakage current density of 300 μA/cm2 at 500 V. Furthermore, the leakage current becomes unacceptable at temperatures higher than 100°C. A 4H-SiC merged PiN Schottky (MPS) diode uses interdigitated p+ regions between Schottky contacts to limit the electric field at the Schottky interface during the off-state operation of the device. It has a low on-state voltage drop and fast switching of a Schottky diode and offers a low off-state leakage current like the PiN diode. The on-state and off-state performance was optimized by analyzing the effect of adjacent p+ region width and spacing by 2D device simulations
  • Keywords
    Schottky diodes; losses; p-i-n diodes; semiconductor materials; silicon compounds; switching; titanium; 2D device simulations; 4H-SiC Schottky diodes; 4H-SiC merged PiN Schottky diode; MPS diodes; Schottky interface; SiC; SiC Schottky-type rectifier; Ti; Ti Schottky diode; adjacent p+ region spacing; adjacent p+ region width; dual use; electric field limiting; fast switching; forward current density; high efficiency; interdigitated p+ regions; low barrier height; low off-state leakage current; low on-state voltage drop; motor drive circuits; off-state operation; off-state performance; on-state performance; power-electronic systems; switching losses elimination; switching power supplies; very high room temperature leakage current density; Leakage current; Motor drives; Power supplies; Rectifiers; Schottky diodes; Silicon carbide; Switches; Switching circuits; Switching loss; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Engineering Conference and Exhibit, 2000. (IECEC) 35th Intersociety
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    1-56347-375-5
  • Type

    conf

  • DOI
    10.1109/IECEC.2000.870676
  • Filename
    870676