3569216

An universal BIST methodology for interconnects

ChauChin Su

1993

1615

1618

Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design methodology; Hardware; Integrated circuit interconnections; Legged locomotion; Pins; Topology;

English

ieee

Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on

0-7803-1281-3

conf

692973