DocumentCode :
3569474
Title :
Cost Efficient Methods to Improve Performance of Broadcast Scan
Author :
Wang, Seongmoon ; Wei, Wenlong
Author_Institution :
NEC Labs. America, Princeton, NJ
fYear :
2008
Firstpage :
163
Lastpage :
169
Abstract :
This paper presents techniques to improve compressions by improving fault coverage that can be achieved by broadcast scan. Due to reconvergent gates that artificially occur in broadcast scan, broadcast scan fault coverage is often much lower than standard serial scan fault coverage. The proposed scan chain reordering technique improves broadcast scan fault coverage by minimizing the number of reconvergent gates and hence no or very small number of test patterns are required to be applied by standard serial scan to detect faults undetected by broadcast scan. This increases the overall compression ratio. To eliminate or minimize increase in routing overhead, the distance that each scan cell can be relocated by the scan chain reordering procedure is limited. Test points are inserted to further reduce correlation among outputs of scancells. The proposed scan chain reordering technique improved broadcast scan fault converge by up to 8.5%. Large fault coverage improvement was achieved by the proposed method, especially for circuits that suffer low broadcast scan fault coverage. Broadcast scan fault coverage for the largest two industrial designs was even higher than standard serial scan fault coverage.
Keywords :
automatic test equipment; failure analysis; integrated circuit testing; logic testing; automatic test equipments; broadcast scan fault coverage; input test data compression; reconvergent gates; scan chain reordering; test point insertion; Automatic test pattern generation; Automatic testing; Broadcasting; Circuit faults; Circuit testing; Costs; Fault detection; National electric code; Test data compression; Test pattern generators; Broadcast Scan; Input Test Data Compression; Scan Chain Reordering; Test Point Insertion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
ISSN :
1081-7735
Print_ISBN :
978-0-7695-3396-4
Type :
conf
DOI :
10.1109/ATS.2008.72
Filename :
4711577
Link To Document :
بازگشت