DocumentCode :
3569564
Title :
Measuring application error rates for network processors
Author :
Mallik, A. ; Wildrick, M.C. ; Memik, G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Northwestern Univ., Evanston, IL, USA
Volume :
2
fYear :
2004
Abstract :
Faults in computer systems can occur due to a variety of reasons. In many systems, an error has a binary effect, i.e. the output is either correct or it is incorrect. However, networking applications exhibit different properties. For example, although a portion of the code behaves incorrectly due to a fault, the application can still work correctly. Integrity of a network system is often unchanged during faults. Therefore, measuring the effects of faults on the network processor applications require new measurement metrics to be developed. In this paper, we highlight essential application properties and data structures that can be used to measure the error behavior of network processors. Using these metrics, we study the error behavior of seven representative networking applications under different cache access fault probabilities.
Keywords :
computer networks; error statistics; measurement systems; microprocessor chips; network computers; application error rates; application properties; binary effect; cache access fault probabilities; computer systems faults; data structures; error behavior; error measurements; measurement metrics; network processors; network system integrity; Application software; Application specific integrated circuits; Circuit faults; Computer errors; Data structures; Error analysis; Error correction; Hardware; Packaging; Process design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2004. MWSCAS '04. The 2004 47th Midwest Symposium on
Print_ISBN :
0-7803-8346-X
Type :
conf
DOI :
10.1109/MWSCAS.2004.1354210
Filename :
1354210
Link To Document :
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