DocumentCode :
35696
Title :
High-Frequency Gate-All-Around Vertical InAs Nanowire MOSFETs on Si Substrates
Author :
Johansson, Sofia ; Memisevic, Elvedin ; Wernersson, Lars-Erik ; Lind, Erik
Author_Institution :
Dept. of Electr. & Inf. Technol., Lund Univ., Lund, Sweden
Volume :
35
Issue :
5
fYear :
2014
fDate :
May-14
Firstpage :
518
Lastpage :
520
Abstract :
We demonstrate a vertical InAs nanowire MOSFET integrated on Si substrate with an extrinsic peak cut-off frequency of 103 GHz and a maximum oscillation frequency of 155 GHz. The transistor has a transconductance of 730 mS/mm and is based on arrays of nanowires with gate-all-around and high-κ gate dielectric. Furthermore, small-signal modeling shows a ~80% reduction of the total parasitic gate capacitance when the metal pad overlap in the transistors is reduced through additional patterning.
Keywords :
III-V semiconductors; MOSFET; indium compounds; nanowires; silicon; wide band gap semiconductors; InAs; Si; frequency 155 GHz; high-κ gate dielectric; high-frequency gate-all-around vertical nanowire MOSFET; small-signal modeling; total parasitic gate capacitance; Capacitance; Logic gates; MOSFET; Radio frequency; Resistance; Substrates; III-V; III??V; InAs; InAs.; MOSFET; Nanowire; RF; transistor;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2014.2310119
Filename :
6767079
Link To Document :
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