Evaluation of 8×8 reverse etched avalanche photo diode arrays for oceanographic lidar systems

Testing has been conducted on 8×8 Avalanche Photo Diode (APD) arrays derived from large area (16 mm) APDs, both produced by Advanced Photonix, Inc. The array structure was produced using a novel reverse etching process. Tests have been conducted measuring crosstalk, bandwidth, rise and fall times, gain, effective pixel size, and noise characteristics. Measurements have been made as functions of wavelength, optical intensity, and bias voltage. Cross-talk between pixels was characterized under both CW and pulsed (3 nsec) conditions. The effective pixel size was measured by scanning a small laser spot (.25 mm) across the pixel under test while monitoring the output current. The measured pixel size was approximately 1 mm. This matched very well with the expected physical pixel size of 1 mm