Title :
Evaluation of 8×8 reverse etched avalanche photo diode arrays for oceanographic lidar systems
Author :
Allocca, D. ; Contarino, V.M. ; Squicciarini, M.F. ; Billmers, R.I.
Author_Institution :
Ampac Inc., Norristown, PA, USA
Abstract :
Testing has been conducted on 8×8 Avalanche Photo Diode (APD) arrays derived from large area (16 mm) APDs, both produced by Advanced Photonix, Inc. The array structure was produced using a novel reverse etching process. Tests have been conducted measuring crosstalk, bandwidth, rise and fall times, gain, effective pixel size, and noise characteristics. Measurements have been made as functions of wavelength, optical intensity, and bias voltage. Cross-talk between pixels was characterized under both CW and pulsed (3 nsec) conditions. The effective pixel size was measured by scanning a small laser spot (.25 mm) across the pixel under test while monitoring the output current. The measured pixel size was approximately 1 mm. This matched very well with the expected physical pixel size of 1 mm
Keywords :
arrays; avalanche photodiodes; geophysical equipment; oceanographic equipment; oceanographic techniques; optical crosstalk; optical radar; remote sensing by laser beam; seafloor phenomena; 440 to 700 nm; 64 pixel; Advanced Photonix; bandwidth; bias voltage; bottom mapping; coss-talk; crosstalk; effective pixel size; equipment; fall time; geophysical method; image detector; imaging lidar; laser instrument; measurement technique; noise characteristics; ocean; optical imaging; optical intensity; remote sensing; reverse etched avalanche photo diode array; reverse etching process; rise time; sea; seafloor geology; topography; Bandwidth; Crosstalk; Diodes; Etching; Gain measurement; Noise measurement; Optical noise; Size measurement; Testing; Wavelength measurement;
Conference_Titel :
OCEANS '95. MTS/IEEE. Challenges of Our Changing Global Environment. Conference Proceedings.
Print_ISBN :
0-933957-14-9
DOI :
10.1109/OCEANS.1995.528588
