• DocumentCode
    3570447
  • Title

    Noise temperature estimates for a next generation very large microwave array [HEMT LNAs]

  • Author

    Weinreb, S.

  • Author_Institution
    Dept. of Phys. & Astron., Massachusetts Univ., Amherst, MA, USA
  • Volume
    2
  • fYear
    1998
  • Firstpage
    673
  • Abstract
    This paper estimates the noise temperature as a function of frequency for amplifiers covering the 1 to 10 GHz range utilizing state-of-the-art HEMT transistors operating at temperatures of 300 K, 80 K, and 20 K. The analysis includes the effect of loss and bandwidth of the input matching network.
  • Keywords
    HEMT integrated circuits; MMIC amplifiers; impedance matching; integrated circuit noise; microwave antenna arrays; radiotelescopes; 1 to 10 GHz; 20 to 300 K; HEMT transistors; MMIC LNA; SETI; VLA; amplifiers; bandwidth; frequency; input matching network; loss; next generation microwave array; noise temperature estimates; very large microwave array; Bandwidth; Circuit noise; Electrical resistance measurement; Gallium arsenide; HEMTs; Indium phosphide; Microwave antenna arrays; Noise generators; Noise measurement; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1998 IEEE MTT-S International
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-4471-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1998.705081
  • Filename
    705081