Title :
A heuristic global optimization algorithm and its application to CMOS circuit variability minimization
Author :
Ming Qu ; Styblinski, M.A.
Author_Institution :
Texas A&M University
Keywords :
Circuit testing; Clustering algorithms; Heuristic algorithms; Integrated circuit testing; Minimization methods; Optimization methods; Parameter extraction; Reflection; Robustness; Switches;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Print_ISBN :
0-7803-1281-3
