Title :
Resolution of cavity probes of scanning microwave microscopy
Author :
Gordienko, Y.E. ; Gud, Y.I. ; Larkin, S.Y. ; Slipchenko, N.I.
Author_Institution :
Kharkov Nat. Univ. of Radioelektroniks, Kharkov, Ukraine
Abstract :
The results on numerical studies of the dependence of the fundamental signal scanning microwave microscopy upon the radius of tip shape of the cavity probe are described.
Keywords :
atomic force microscopy; network analysers; cavity probe; fundamental signal scanning microwave microscopy; tip shape; Cavity resonators; Microscopy; Microwave measurements; Probes; Shape; Signal resolution; Spatial resolution;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2012 22nd International Crimean Conference
Print_ISBN :
978-1-4673-1199-1
