DocumentCode :
3571517
Title :
Ultra-short pulse meter of current-voltage and capacitance-voltage characteristics for Ni LabVIEW
Author :
Semyonov, E.V.
Author_Institution :
Tomsk State Univ. of Control Syst. & Radioelectron., Tomsk, Russia
fYear :
2012
Firstpage :
857
Lastpage :
858
Abstract :
The peculiarities of practical realization of the method, that provides measurement of the current-voltage and capacitance-voltage characteristics by ultra-short pulses, are considered.
Keywords :
capacitance measurement; electric current measurement; nickel; virtual instrumentation; voltage measurement; LabVIEW; Ni; capacitance-voltage measurement characteristics; current-voltage measurement characteristics; ultra-short pulse meter; Capacitance-voltage characteristics; Current measurement; Integrated circuits; Optical pulse generation; Pulse measurements; Semiconductor device measurement; Software;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2012 22nd International Crimean Conference
Print_ISBN :
978-1-4673-1199-1
Type :
conf
Filename :
6336223
Link To Document :
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