DocumentCode
3571517
Title
Ultra-short pulse meter of current-voltage and capacitance-voltage characteristics for Ni LabVIEW
Author
Semyonov, E.V.
Author_Institution
Tomsk State Univ. of Control Syst. & Radioelectron., Tomsk, Russia
fYear
2012
Firstpage
857
Lastpage
858
Abstract
The peculiarities of practical realization of the method, that provides measurement of the current-voltage and capacitance-voltage characteristics by ultra-short pulses, are considered.
Keywords
capacitance measurement; electric current measurement; nickel; virtual instrumentation; voltage measurement; LabVIEW; Ni; capacitance-voltage measurement characteristics; current-voltage measurement characteristics; ultra-short pulse meter; Capacitance-voltage characteristics; Current measurement; Integrated circuits; Optical pulse generation; Pulse measurements; Semiconductor device measurement; Software;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology (CriMiCo), 2012 22nd International Crimean Conference
Print_ISBN
978-1-4673-1199-1
Type
conf
Filename
6336223
Link To Document