Title :
Quasioptical reflectometer of internal reflection for carbon plastics surface evaluation
Author :
Bezborodov, V.I. ; Kiseliov, V.K. ; Kuleshov, Ye.M. ; Nesterov, Pavel K. ; Mizrakhi, S.V. ; Sherbatko, I.V. ; Yanovsky, M.S.
Author_Institution :
A.Ya. Usikov Inst. of Radiophys. & Electron., Kharkov, Ukraine
Abstract :
Quasi-optical (QO) reflectometer of internal reflection (IR) on the basis of a hollow dielectric beamguide (HDB) and a number of beamguiding components and devices of THz frequency range is developed. The reflectometer is tested for detection of surface contaminations and sub-surface damages of carbon fiber reinforced plastic (CFRP). The results of the study of CFRP samples with different contaminations in sub-THz frequency range (0.1...0.2) THz are shown.
Keywords :
carbon; plastics; reflectometers; surface contamination; surface treatment; THz frequency range; beamguiding components; carbon fiber reinforced plastic; carbon plastics surface evaluation; hollow dielectric beamguide; internal reflection; quasioptical reflectometer; subsurface damages; surface contaminations; Dielectrics; Electronic mail; Reflection; Surface contamination; Surface waves; Testing;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2012 22nd International Crimean Conference
Print_ISBN :
978-1-4673-1199-1
