Title :
Polarisation dependent scattering loss in thin, shallow-ridge silicon-on-insulator waveguides with resonant lateral leakage
Author :
Nguyen, T.G. ; Mitchell, A.
Author_Institution :
Sch. of Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia
Abstract :
We present an analysis of the polarisation dependent scattering loss due to surface and sidewall roughness in thin, shallow-ridge silicon-on-insulator (SOT) waveguides using three dimensional coupled mode theory. The impact on resonant lateral leakage is discussed.
Keywords :
coupled mode analysis; light polarisation; light scattering; optical losses; optical waveguides; ridge waveguides; silicon-on-insulator; surface roughness; Si-SiO2; polarisation dependent scattering loss; resonant lateral leakage; shallow ridge silicon-on-insulator waveguides; sidewall roughness; surface roughness; three dimensional coupled mode theory; Optical waveguides; Rough surfaces; Scattering; Silicon on insulator technology; Slabs; Surface roughness; Surface waves; Optical waveguides; radiation modes; roughness; scattering loss; silicon on insulator technology;
Conference_Titel :
Optical Fibre Technology (ACOFT), 2010 35th Australian Conference on
DOI :
10.1109/ACOFT.2010.5929934
