DocumentCode :
357205
Title :
Epidemiological and laboratory studies on the cancer risk from electromagnetic fields: an overview
Author :
Ahuja, Y.R. ; Jahan, P. ; Bhargava, S.C.
Author_Institution :
Genetics Dept., Bhagwan Mahavir Med. Res. Centre, Hyderabad, India
fYear :
1999
fDate :
6-8 Dec. 1999
Firstpage :
459
Lastpage :
464
Abstract :
Electricity has played a significant role in modern developments and has become a part of our daily life. But electricity is invariably associated with electric and/or magnetic fields. Consequently, we are surrounded by electromagnetic fields (EMFs). In homes and workplaces we run our gadgets by electricity at power-line frequencies (50 Hz: low frequency). Whereas, wireless communications, including cellular phones, are operated at microwaves and shortwaves (high frequency). The question arises: is excessive exposure to EMFs harmful, more specifically carcinogenic? To answer this question a large number of epidemiological surveys and laboratory studies have been carried out largely during the 1980s and 1990s. The results are controversial and inconclusive. This paper presents a comprehensive overview of the possible detrimental effects of time-dependent EMFs, including some experimental work carried out in the authors´ laboratory. The emphasis is focused on the rise of cancer in humans as a consequence of exposure to EMFs.
Keywords :
biological effects of microwaves; cancer; health hazards; skin; cancer risk; electromagnetic fields; epidemiological studies; humans; laboratory studies; microwaves; power-line frequencies; shortwave; time-dependent EMF; wireless communications; Cancer; Cellular phones; Educational institutions; Electromagnetic fields; Frequency; Genetics; Humans; Laboratories; Magnetic fields; Wireless communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Interference and Compatibility '99. Proceedings of the International Conference on
Print_ISBN :
81-900652-0-3
Type :
conf
DOI :
10.1109/ICEMIC.1999.871683
Filename :
871683
Link To Document :
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