Title :
Transient response of electronic devices and their failure mechanism
Author :
Tyagi, Satish K.
Author_Institution :
DEAL, Dehradun, India
Abstract :
The paper presents the failure mechanism of some of the commonly used components in electronic systems when transients appear upon them. It is estimated theoretically that low power transistors and microwave mixer diode are most susceptible to incoming transients with energy of the order of 1 μJ or even less.
Keywords :
electromagnetic pulse; failure analysis; microwave diodes; microwave mixers; power transistors; transient response; EMP; electronic devices; electronic systems; failure mechanism; incoming transients; low power transistors; microwave mixer diode; transient response; Circuits; EMP radiation effects; Electromagnetic transients; Estimation theory; Failure analysis; Laboratories; Microwave devices; Power transistors; Resistors; Voltage;
Conference_Titel :
Electromagnetic Interference and Compatibility '99. Proceedings of the International Conference on
Print_ISBN :
81-900652-0-3
DOI :
10.1109/ICEMIC.1999.871691
