• DocumentCode
    3572436
  • Title

    Limitations of Electrical Interconnections in Electronic Systems

  • Author

    Noll, T.G.

  • Author_Institution
    Corporate Research and Development, SIEMENS AG, Munich F.R.G.
  • fYear
    1992
  • Firstpage
    561
  • Lastpage
    561
  • Keywords
    Bandwidth; Delay effects; Electronics packaging; Geometry; Integrated circuit interconnections; Lead compounds; Microelectronics; Research and development; Semiconductor device reliability; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
  • Print_ISBN
    444894780
  • Type

    conf

  • Filename
    5435160
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3572436