Title :
Evaluation of lot release policies for semiconductor manufacturing systems
Author :
Sandell, Raka ; Srinivasan, Krishna
Author_Institution :
Motorola Inc.
Keywords :
Application specific integrated circuits; Integrated circuit measurements; Job shop scheduling; Manufacturing industries; Manufacturing systems; Optimal scheduling; Pollution measurement; Production facilities; Semiconductor device manufacture; Throughput;
Conference_Titel :
Simulation Conference, 1996. Proceedings. Winter
Print_ISBN :
0-7803-3383-7
DOI :
10.1109/WSC.1996.873398