DocumentCode
3573259
Title
The Operation of Partially Depleted SOI Inverters from Room Down to Liquid Helium Temperature
Author
Simoen, E. ; Claeys, C.
Author_Institution
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
fYear
1994
Firstpage
569
Lastpage
572
Abstract
The operation of inverters, fabricated in a 1 ¿m partially depleted SOI CMOS technology is investigated from room temperature down to liquid helium. It is demonstrated that the transfer characteristics suffer from the floating-body anomalies, like the kink and the breakdown/latch behaviour. Additionally, at 4.2 K, hysteresis, which is related to the cryogenic (freeze-out) behaviour of the n-MOSFETs occurs. Finally, practical measures to reduce or eliminate these anomalies are discussed. Better results are obtained by using the twin-gate configuration, compared with a grounded body tie.
Keywords
Breakdown voltage; CMOS technology; Cryogenics; Electric breakdown; Helium; Hysteresis; Inverters; MOSFET circuits; Temperature; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
Print_ISBN
863321579
Type
conf
Filename
5435782
Link To Document