• DocumentCode
    3573259
  • Title

    The Operation of Partially Depleted SOI Inverters from Room Down to Liquid Helium Temperature

  • Author

    Simoen, E. ; Claeys, C.

  • Author_Institution
    IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
  • fYear
    1994
  • Firstpage
    569
  • Lastpage
    572
  • Abstract
    The operation of inverters, fabricated in a 1 ¿m partially depleted SOI CMOS technology is investigated from room temperature down to liquid helium. It is demonstrated that the transfer characteristics suffer from the floating-body anomalies, like the kink and the breakdown/latch behaviour. Additionally, at 4.2 K, hysteresis, which is related to the cryogenic (freeze-out) behaviour of the n-MOSFETs occurs. Finally, practical measures to reduce or eliminate these anomalies are discussed. Better results are obtained by using the twin-gate configuration, compared with a grounded body tie.
  • Keywords
    Breakdown voltage; CMOS technology; Cryogenics; Electric breakdown; Helium; Hysteresis; Inverters; MOSFET circuits; Temperature; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
  • Print_ISBN
    863321579
  • Type

    conf

  • Filename
    5435782