DocumentCode :
3573681
Title :
A New Lateral Insulated Gate Bipolar Transistor Structure with Improved Electrical Characteristics
Author :
Vellvehf, M. ; Godignon, P. ; Flores, D. ; Fern??ndez, J. ; Hidalgo, S. ; Rebollo, J. ; Mill??n, J.
Author_Institution :
Centro Nacional de Microelectr?nica (CNM-CSIC)., 08193 Bellaterra. Barcelona. Spain. Tel: + 34 3 5802625, Fax: + 34 3 5801496, E-mail: miquel@cnm.es
fYear :
1995
Firstpage :
639
Lastpage :
642
Abstract :
This paper is aimed at the experimental demonstration of a new LIGBT structure with enhanced latch-up characteristics for power IC applications. For this purpose, several LIGBTs have been fabricated, which allows the comparison of the electrical characteristics of the proposed structure with those of previously reported LIGBTs. The RESURFed devices show a 360 V breakdown voltage and structures with and without shorted anode have been considered. The proposed modified LIGBT does not exhibit latch-up and shows a good compromise between static and dynamic characteristics.
Keywords :
Anodes; Cathodes; Electric resistance; Electric variables; Immune system; Insulated gate bipolar transistors; Insulation; Power integrated circuits; Substrates; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
Print_ISBN :
286332182X
Type :
conf
Filename :
5436075
Link To Document :
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