Title :
Improving the accuracy of numerical results by a spherical-multipole based post-processing
Author :
Oetting, Claus-Christian ; Klinkenbusch, Ludger
Author_Institution :
Computational Electromagn. Group, Kiel Univ., Germany
fDate :
6/24/1905 12:00:00 AM
Abstract :
Spherical-multipole analysis is applied to improve the far-field results obtained from numerically computed near-field data. This is done by means of a spatial-frequency filtering technique, since the spatial spectral-radius of the exact problem is limited and depends only on the maximal electric distance of the sources to the well-chosen origin. Neglecting the higher spectral parts, i.e. the higher-order multipole amplitudes in the far-field representation, means neglecting spurious and erroneous field parts. The method is applicable for frequency-domain methods as well as for time-domain fields, provided that the time spectrum band of the field is known. Exemplarily, we apply the spatial-frequency filtering technique while performing a spherical-multipole based time-domain near-to-far-field transform for the finite-difference time-domain (FDTD) method. In the example, we consider scattering by a perfectly electrically conducting (PEC) half-sphere illuminated by a Gaussian-type modulated plane electromagnetic wave.
Keywords :
conducting bodies; electromagnetic wave propagation; electromagnetic wave scattering; finite difference time-domain analysis; FDTD method; finite-difference time-domain method; frequency-domain methods; near-to-far-field transform; perfect electrical conductor; plane electromagnetic wave; post-processing; scattering; spatial spectral-radius; spatial-frequency filtering; spherical-multipole analysis; time-domain fields; Computational electromagnetics; Electromagnetic analysis; Electromagnetic fields; Electromagnetic scattering; Finite difference methods; Green´s function methods; Surface impedance; Surface waves; Thumb; Time domain analysis;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2002. IEEE
Print_ISBN :
0-7803-7330-8
DOI :
10.1109/APS.2002.1016247