Title :
Fluorescent magnetic particle inspection device based on digital image processing
Author :
Jianlan Luo ; Zhewen Tian ; Jintao Yang
Author_Institution :
Sch. of Automotive Eng., Wuhan Univ. of Technol., Wuhan, China
Abstract :
Fluorescent magnetic particle inspection is widely applied in industry production, however; traditional ways are manual and depend on individuals´ experience, which can also cause damage to workers´ eyes. An automatic fluorescent magnetic particle inspection device is presented in this paper. A series of image processing methods have been investigated, which are put into a combination for detecting flaws in images automatically. And we propose a wavelet-based Canny operator to extract outlines of flaws in images, which is more effective than common Canny operator, and could constrain noises at a reasonable level. Results suggest that this novel automatic inspection device offers a low labor intensity but more effective way for flaw detection work, and image processing methods proposed in this paper are feasible.
Keywords :
automatic optical inspection; flaw detection; image processing; magnetic particles; mathematical operators; wavelet transforms; automatic fluorescent magnetic particle inspection device; digital image processing method; flaw detection; flaw extraction; industry production; labor intensity; wavelet-based Canny operator; Cameras; Fluorescence; Inspection; Magnetic particles; Magnetic resonance imaging; Wavelet transforms; Fluorescent magnetic particle inspection; digital image processing; wavelet-based Canny Operator;
Conference_Titel :
Intelligent Control and Automation (WCICA), 2014 11th World Congress on
DOI :
10.1109/WCICA.2014.7053688