Title :
The application of simulated annealing K-means clustering algorithm in combination modeling
Author :
Dong Tao ; Ding Jian ; Yang Hui-zhong ; Lei Yu ; Tao Hongfeng
Author_Institution :
Key Lab. of Adv. Process Control for Light Ind., Jiangnan Univ., Wuxi, China
Abstract :
Traditional K-means clustering algorithm easily fall into local extremum. A maximum distances product algorithm is used to optimize the initial clustering centers and a K-means clustering algorithm with simulated annealing (SA) is promoted. The proposed method uses SA to optimize the clustering pattern in clustering analysis which can achieve global optimization. A combination model based on support vector machine (SVM) is established. The method is applied to a soft sensor modeling for the quality index in a Bisphenol A production process. The simulation result shows that the change trend of phenol content is tracked effectively and data classification result is improved by the algorithm. It also shows that the estimation precision of the soft sensor model is improved which demonstrates the potential application in industry field.
Keywords :
chemical technology; organic compounds; pattern classification; pattern clustering; simulated annealing; support vector machines; Bisphenol A production process; SA; SVM; clustering analysis; clustering pattern; combination modeling; data classification; global optimization; maximum distances product algorithm; phenol content; quality index; simulated annealing K-means clustering algorithm; soft sensor modeling; support vector machine; Algorithm design and analysis; Classification algorithms; Clustering algorithms; Industries; Simulated annealing; Support vector machines; Training data; Combination SVM; Initial Cluster Centers; K-means Clustering Algorithm; Simulated Annealing;
Conference_Titel :
Intelligent Control and Automation (WCICA), 2014 11th World Congress on
DOI :
10.1109/WCICA.2014.7053702