DocumentCode :
3573923
Title :
A parameterization method based on multi-method collaboration
Author :
Yumin Ma ; Peiming Guo ; Fei Qiao ; Xi Chen ; Hai Gao
Author_Institution :
Sch. of Electron. & Inf. Eng., Tongji Univ., Shanghai, China
fYear :
2014
Firstpage :
5907
Lastpage :
5910
Abstract :
Due to the inherent advantages, limitations, as well as the complementarity of different parameterization methods, a collaborative mechanism of multi-parameterization method is proposed in this paper, that is, a collaborative parameter analysis model is developed on the basis of multi-parameterization method analysis results (such as regression analysis method, improved neural network method, granularity analysis method, etc.) to improve the accuracy and reliability of analysis result. At the end of this paper, accuracy and effectiveness of the proposed method are verified through a practical analysis of failure prediction for the heating heads of semiconductor test equipments.
Keywords :
failure analysis; neural nets; regression analysis; semiconductor device testing; test equipment; collaborative mechanism; collaborative parameter analysis model; failure prediction; granularity analysis method; improved neural network method; multimethod collaboration; multiparameterization method analysis; regression analysis method; semiconductor test equipment; Analytical models; Collaboration; Heating; Magnetic heads; Neural networks; Predictive models; Regression analysis; dynamic parameter; failure prediction; multi- method collaboration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Automation (WCICA), 2014 11th World Congress on
Type :
conf
DOI :
10.1109/WCICA.2014.7053730
Filename :
7053730
Link To Document :
بازگشت