DocumentCode :
3574276
Title :
Comparative study of Pareto Type II with HLD in assessing the software reliability with order statistics approach using SPC
Author :
Kumari, K. Sita ; Amulya, B. ; Prasad, R. Satya
Author_Institution :
Dept. of IT, VR Siddhartha Eng. Coll., Vijayawada, India
fYear :
2014
Firstpage :
1630
Lastpage :
1636
Abstract :
Software reliability is one of the most important characteristics of software quality. Its measurement and management technologies employed during the software life cycle are essential for producing and maintaining quality/reliable software systems. Over the last several decades, many Software Reliability Growth Models (SRGMs) have been developed to greatly facilitate engineers and managers in tracking and measuring the growth of reliability as software is being improved. Statistical process control (SPC) is a branch of statistics that combines rigorous time series analysis methods with graphical presentation of data, often yielding insights into the data more quickly and in a way more understandable to lay decision makers. SPC has been applied to forecast the software failures and improve the software reliability. In this paper we proposed Pareto Type II Distribution model with an order statistic approach and applied SPC to monitor the failures. Also the proposed model is compared with Half Logistic Distribution considering time domain data based on Non Homogeneous Poisson Process (NHPP). The parameters are estimated using the Maximum Likelihood Estimation. The failure data is analyzed with both the models and the results are exhibited through control charts.
Keywords :
control charts; data analysis; maximum likelihood estimation; software maintenance; software quality; software reliability; statistical process control; HLD; NHPP; Pareto type II distribution model; SPC; SRGMs; control charts; failure data analysis; failure monitoring; graphical data presentation; management technology; maximum likelihood estimation; measurement technology; nonhomogeneous poisson process; order statistic approach; order statistics approach; parameter estimation; software failure forecasting; software life cycle; software quality; software reliability assessment; software reliability growth models; software reliability improvement; software system quality maintenance; software system reliability maintenance; statistical process control; time domain data; time series analysis methods; Control charts; Equations; Monitoring; Process control; Software; Software reliability; Control Charts; HLD; MLE; NHPP; Order Statistics; Pareto Type II; SPC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuit, Power and Computing Technologies (ICCPCT), 2014 International Conference on
Print_ISBN :
978-1-4799-2395-3
Type :
conf
DOI :
10.1109/ICCPCT.2014.7054824
Filename :
7054824
Link To Document :
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