DocumentCode :
357471
Title :
Scattering characteristics of dielectric periodic structures in the case of oblique incidence
Author :
Yang Li ; Xu Shanjia ; Wu Xianliang
Author_Institution :
Univ. of Sci. & Technol. of China, China
Volume :
1
fYear :
2000
fDate :
16-21 July 2000
Firstpage :
410
Abstract :
The scattering characteristics of dielectric periodic structures in the general case of oblique incidence are investigated using a method that combines multimode network theory with a rigorous mode matching method. Some interesting wave phenomena are observed. It is demonstrated that the method is suitable for rigorously solving the electromagnetic scattering problems of the dielectric periodic structures and therefore lays a sound foundation for further research on accurately analyzing the wave phenomena and effectively designing the related periodic structures in MMW and optical integrated circuits.
Keywords :
dielectric bodies; electromagnetic wave scattering; mode matching; periodic structures; MM wave integrated circuits; dielectric periodic structures; electromagnetic scattering; multimode network theory; oblique incidence; optical integrated circuits; rigorous mode matching; wave phenomena; Acoustic scattering; Dielectrics; Electromagnetic analysis; Electromagnetic scattering; Integrated optics; Mode matching methods; Optical design; Optical scattering; Periodic structures; Photonic integrated circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2000. IEEE
Conference_Location :
Salt Lake City, UT, USA
Print_ISBN :
0-7803-6369-8
Type :
conf
DOI :
10.1109/APS.2000.873849
Filename :
873849
Link To Document :
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