Title :
Monitoring of particle deposition in cleanrooms: State-of-the-art
Author :
Menant, Nina ; Lafontan, Xavier ; Faye, Delphine ; Lellouchi, Djemel ; Nouet, Pascal
Author_Institution :
Service Labs. & Expertise, Univ. de Montpellier, Toulouse, France
Abstract :
Cleanrooms are classified by the cleanliness of air and surface. Classification defined by ISO 14644-1 and 14644-9 is given by the number of particle larger than a critical size in a quantity of volume or surface. No reliable data give the correlation between the air and surface particulate contamination. Various environmental parameters and operating factors determine the particle deposition rate in cleanrooms. The particle deposition real-time monitoring is a concern for numerous application fields such as microelectronics, imaging devices, pharmaceutical industries, agribusiness and space where the risk of contamination by sedimentation of particle is critical for sensitive instruments. New developments in the field of particle deposition monitoring devices are necessary to better classify cleanrooms and improve the control of the cleanliness of surfaces.
Keywords :
particle detectors; sedimentation; surface contamination; ISO 14644-1 standard; ISO 14644-9 standard; agribusiness; air particulate contamination; cleanroom; environmental parameter; imaging device; microelectronics; particle deposition monitoring device; pharmaceutical industry; reliability; sedimentation; surface particulate contamination; Atmospheric measurements; Monitoring; Particle measurements; Pollution measurement; Surface contamination; Surface treatment; cleanroom; micro-sensor; monitoring; particulate contamination; real time;
Conference_Titel :
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2014 Symposium on
Print_ISBN :
978-2-35500-028-7
DOI :
10.1109/DTIP.2014.7056699