Title :
RF modeling of p-n-p-n double-gate tunneling field-effect transistors
Author :
Marjani, Saeid ; Hosseini, Seyed Ebrahim
Author_Institution :
Dept. of Electr. Eng., Ferdowsi Univ. of Mashhad, Mashhad, Iran
Abstract :
This paper presents radio-frequency (RF) modeling of p-n-p-n double-gate tunneling field-effect transistors (TFETs). The p-n-p-n TFETs are evaluated for various RF parameters such as cut-off frequency, maximum oscillation frequency, gate-source capacitance, gate-drain capacitance, channel resistance, and transconductance. Direct comparisons of high-frequency performances and extracted parameters are made with conventional TFETs. A nonquasistatic radio-frequency model has been used, along with SPICE simulations to investigate p-n-p-n TFETs with RF parameters extracted from TCAD simulation Y-parameters. The results show excellent agreements with the TCAD simulation results for the high frequency range up to the cut-off frequency for the millimeter-wave applications.
Keywords :
SPICE; field effect transistors; semiconductor device models; technology CAD (electronics); RF modeling; SPICE; TCAD simulation; TFET; channel resistance; cut-off frequency; gate-drain capacitance; gate-source capacitance; maximum oscillation frequency; nonquasistatic radio-frequency model; p-n-p-n double-gate tunneling field-effect transistors; radio-frequency modeling; transconductance; Capacitance; Cutoff frequency; Logic gates; Radio frequency; Semiconductor process modeling; Tunneling; Modeling; Nonquasistatic (NQS); Radio-frequency (RF); Tunneling field-effect transistor (TFET); p-n-p-n;
Conference_Titel :
Millimeter-Wave and Terahertz Technologies (MMWATT), 2014 Third Conference on
Print_ISBN :
978-1-4799-6590-8
DOI :
10.1109/MMWaTT.2014.7057188