• DocumentCode
    3575480
  • Title

    RF modeling of p-n-p-n double-gate tunneling field-effect transistors

  • Author

    Marjani, Saeid ; Hosseini, Seyed Ebrahim

  • Author_Institution
    Dept. of Electr. Eng., Ferdowsi Univ. of Mashhad, Mashhad, Iran
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents radio-frequency (RF) modeling of p-n-p-n double-gate tunneling field-effect transistors (TFETs). The p-n-p-n TFETs are evaluated for various RF parameters such as cut-off frequency, maximum oscillation frequency, gate-source capacitance, gate-drain capacitance, channel resistance, and transconductance. Direct comparisons of high-frequency performances and extracted parameters are made with conventional TFETs. A nonquasistatic radio-frequency model has been used, along with SPICE simulations to investigate p-n-p-n TFETs with RF parameters extracted from TCAD simulation Y-parameters. The results show excellent agreements with the TCAD simulation results for the high frequency range up to the cut-off frequency for the millimeter-wave applications.
  • Keywords
    SPICE; field effect transistors; semiconductor device models; technology CAD (electronics); RF modeling; SPICE; TCAD simulation; TFET; channel resistance; cut-off frequency; gate-drain capacitance; gate-source capacitance; maximum oscillation frequency; nonquasistatic radio-frequency model; p-n-p-n double-gate tunneling field-effect transistors; radio-frequency modeling; transconductance; Capacitance; Cutoff frequency; Logic gates; Radio frequency; Semiconductor process modeling; Tunneling; Modeling; Nonquasistatic (NQS); Radio-frequency (RF); Tunneling field-effect transistor (TFET); p-n-p-n;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Millimeter-Wave and Terahertz Technologies (MMWATT), 2014 Third Conference on
  • Print_ISBN
    978-1-4799-6590-8
  • Type

    conf

  • DOI
    10.1109/MMWaTT.2014.7057188
  • Filename
    7057188