DocumentCode
3575583
Title
Design of a nanometer five-dimension adjusting frame used for star simulation facility
Author
Qimeng Chen ; Guoyu Zhang ; Zhe Wang
Author_Institution
Sch. of Photoelectric Eng., Changchun Univ. of Sci. & Technol., Changchun, China
fYear
2014
Firstpage
82
Lastpage
85
Abstract
Aiming at the requirement of an accurate docking between high-accuracy star sensor and star simulator in calibration test, so that to achieve the target of accurately picking up positions of simulation stars, a five-dimension adjusting frame with high resolution and good stability is designed. The functional demands of the adjusting frame are analyzed in depth. In order to reduce docking error and improve alignment efficiency, the general designing program is presented in detail. The three-dimension model of designed frame is given by applying CATIA software. Theoretical calculations show that the adjusting mechanism\´s displacement resolution is 17.6nm and angular resolution is 0.045 arc second. Experimental tests indicate that stability of the adjusting mechanism is quite high, the actual resolutions are 25nm and 0.1 arc second. Calibration test shows that angular distance errors between stars simulated by star simulation facility are all better than 12", can totally meet the technical requirements of calibration test for current high-accuracy star sensor.
Keywords
calibration; design engineering; mechanical testing; sensors; CATIA software; adjusting mechanism displacement resolution; alignment efficiency; angular distance errors; angular resolution; calibration test; docking error; high-accuracy star sensor; nanometer five-dimension adjusting frame design; star simulation facility; star simulator; three-dimension model; Accuracy; Adaptive optics; Assembly; Calibration; Fasteners; Optical sensors; Stability analysis; five-dimension adjustment; nanometer resolution; star simulation facility; structure design; sub arc second resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2014 International Conference on
Type
conf
DOI
10.1109/3M-NANO.2014.7057293
Filename
7057293
Link To Document