Title :
A rigorous analysis of planar antennas having a finite size substrate
Author :
Drissi, M. ; Herve, P. ; Citerne, J.
Author_Institution :
Inst. Nat. des Sci. Appliques, Rennes, France
Abstract :
This paper gives an extended approach for microstrip antennas and circuits having nonhomogeneous and finite size substrate. The formulation combines the method of lines and the Green´s function concept; it includes also a rigorous description of the feeding generator and the matched load termination, which are introduced as additional boundary conditions and used to calculate the scattering parameters for multiport antennas and circuits. The numerical characterization follows the same calibrating steps as the network analyzer. The proposed technique is applied to investigate the influence of the finite size substrate on the propagation characteristics and the scattering matrix parameters of radiating microwave structures. The obtained theoretical results of a microstrip antenna are compared with our measurements and a good agreement is observed.
Keywords :
Green´s function methods; S-matrix theory; S-parameters; antenna radiation patterns; electromagnetic wave propagation; electromagnetic wave scattering; impedance matching; integral equations; method of lines; microstrip antenna arrays; microstrip circuits; multiport networks; 2D integral equation; Green´s function; antenna analysis; antenna radiation patterns; boundary conditions; calibration; feeding generator; finite size substrate; matched load termination; measurements; method of lines; microstrip antennas; microstrip circuits; multiport antennas; multiport circuits; network analyzer; nonhomogeneous substrate; planar antennas; propagation characteristics; radiating microwave structures; scattering matrix parameters; Antenna feeds; Antennas and propagation; Boundary conditions; Circuits; Green´s function methods; Loaded antennas; Microstrip antennas; Microwave propagation; Planar arrays; Scattering parameters;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2000. IEEE
Conference_Location :
Salt Lake City, UT, USA
Print_ISBN :
0-7803-6369-8
DOI :
10.1109/APS.2000.874481