DocumentCode
357589
Title
On matching of equivalent field regions: the aperture problem revisited
Author
Rengarajan, S.R. ; Appel-Hansen, J.
Author_Institution
Dept. of Electr. & Comput. Eng., California State Univ., Northridge, CA, USA
Volume
3
fYear
2000
fDate
16-21 July 2000
Firstpage
1554
Abstract
In aperture problems equivalent magnetic currents in the aperture region are employed for each region by invoking the equivalence principle and by enforcing the boundary condition for the tangential components of the electric field. Subsequently an integral equation is formulated by satisfying the boundary condition for the tangential component of the magnetic field in the aperture region. In the case of an aperture in a perfectly conducting screen with impressed source currents assumed on the one side, we discuss an alternative procedure. This procedure makes use of the fact that in the aperture the tangential component of the magnetic field due to the induced currents in the screen is zero. The use of such a procedure demonstrates the continuity of fields across the aperture. The purpose of this tutorial paper is to compare the new procedure and the conventional procedure and to provide additional insight into the field components, both tangential and normal.
Keywords
boundary integral equations; conducting bodies; electric current; electric fields; electromagnetic induction; magnetic fields; aperture problem; aperture region; boundary condition; electric field tangential components; equivalence principle; equivalent field regions matching; equivalent magnetic currents; fields continuity; impressed source currents; induced currents; integral equation; magnetic field tangential component; normal field components; perfectly conducting screen; scattered field; screen; tangential field components; Apertures; Boundary conditions; Electric potential; Electromagnetic fields; Geometry; Integral equations; Magnetic fields; Moment methods; Scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2000. IEEE
Conference_Location
Salt Lake City, UT, USA
Print_ISBN
0-7803-6369-8
Type
conf
DOI
10.1109/APS.2000.874516
Filename
874516
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