Title :
CMOS architecture for SSTDR implementation
Author :
Madhavan, Sowmya ; Sandya, S.
Author_Institution :
Dept. of Electron. & Commun. Eng., Nitte Meenakshi Inst. of Technol., Bangalore, India
Abstract :
Conventional Reflectomet methods were used for detecting faults on bundles of wires. These bundles of wires may be part of any super system like aircrafts, space shuttle, automobiles or nuclear plants. Faults include open and short circuits, partially open and partially short, frays, solder joints, and other small anomalies. Among the various Reflectometry methods, Spread Spectrum Time Domain Reflectometry (SSTDR) is practically feasible for a CMOS solution. SSTDR is found to be non-interfering with digital signals. Here, we are proposing a CMOS architecture which implements the SSTDR algorithm. The proposed CMOS architecture consists of both analog and digital modules which can be developed into an integrated circuit which can automatically detect faults on wires with precisions on the order of a few inches.
Keywords :
CMOS integrated circuits; time-domain reflectometry; CMOS architecture; CMOS solution; SSTDR algorithm; analog modules; digital modules; integrated circuit; reflectometry methods; spread spectrum time domain reflectometry; Aircraft; CMOS integrated circuits; Circuit faults; Reflectometry; Sensors; Wires; Wiring; Filter; Multiplier; PN sequence generator; Reflectometry; Spread Spectrum Time Domain Reflectometry;
Conference_Titel :
Circuits, Communication, Control and Computing (I4C), 2014 International Conference on
Print_ISBN :
978-1-4799-6545-8
DOI :
10.1109/CIMCA.2014.7057756