Title :
Single event transient tolerant high speed phase frequency detector for PLL based frequency synthesizer
Author :
Prasad, Varsha ; Sandya, S.
Author_Institution :
Dept. of Electron. & Commun., Nitte Meenakshi Inst. of Technol., Bangalore, India
Abstract :
In this paper Radiation Hardened by Design (RHBD) Technique is used to design a high speed Phase Frequency Detector (PFD). The PFD output is not related to input duty cycle. The PFD is tolerant to Single Event Transient (SET) effect. The design is implemented using TSMC 0.35μm CMOS process. It is used in harsh radiation environments suitable for high speed space applications.
Keywords :
CMOS integrated circuits; frequency synthesizers; phase detectors; phase locked loops; radiation hardening (electronics); PLL based frequency synthesizer; RHBD technique; SET effect; TSMC CMOS process; high speed PFD; high speed phase frequency detector; radiation hardened by design technique; single event transient effect; size 0.35 mum; CMOS integrated circuits; Clocks; Phase frequency detector; Phase locked loops; Radiation hardening (electronics); Transient analysis; Tunneling magnetoresistance; PFD; PLL; RHBD; SET;
Conference_Titel :
Circuits, Communication, Control and Computing (I4C), 2014 International Conference on
Print_ISBN :
978-1-4799-6545-8
DOI :
10.1109/CIMCA.2014.7057761
