• DocumentCode
    357624
  • Title

    An improved algorithm for microwave imaging of parallel perfectly conducting cylinders

  • Author

    Anyong Qing ; Ching Kwang Lee ; Shiwen Yang

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
  • Volume
    3
  • fYear
    2000
  • fDate
    16-21 July 2000
  • Firstpage
    1772
  • Abstract
    The electromagnetic inverse scattering problem has been one of the most challenging research topics due to its considerable practical importance in various areas of technology. A variety of algorithms have been previously proposed. In this paper a novel algorithm, the real-coded genetic algorithm-Newton-Kantorivitch method (RGA-NKM), which aims to improve the converging performance of the RGA with the help of NKM for microwave imaging of parallel perfectly conducting cylinders, is proposed and presented. The main idea of the algorithm is to perform a Newton-Kantorivitch type search for the local optimum after the genetic operations in each genetic evolution to improve the local search ability of RGA. Numerical results and comparisons with both RGA and NKM demonstrate that although the simplicity of RGA is lost, the convergence is sped up significantly while the other merits of RGA are retained.
  • Keywords
    Newton method; conducting bodies; convergence of numerical methods; electromagnetic wave scattering; genetic algorithms; inverse problems; microwave imaging; Newton-Kantorivitch method; Newton-Kantorivitch type search; RGA-NKM; convergence performance; genetic evolution; improved algorithm; local optimum; microwave imaging; parallel perfectly conducting cylinders; real-coded genetic algorithm; Electric variables measurement; Electromagnetic scattering; Engine cylinders; Genetics; Image reconstruction; Inverse problems; Microwave imaging; Microwave theory and techniques; Scattering parameters; Shape measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2000. IEEE
  • Conference_Location
    Salt Lake City, UT, USA
  • Print_ISBN
    0-7803-6369-8
  • Type

    conf

  • DOI
    10.1109/APS.2000.874587
  • Filename
    874587