• DocumentCode
    3576495
  • Title

    Reduced Recursive Inclusion-exclusion Principle for the probability of union events

  • Author

    Chen, S.G.

  • Author_Institution
    Dept. of Ind. Manage., Tungnan Univ., Taipei, Taiwan
  • fYear
    2014
  • Firstpage
    11
  • Lastpage
    13
  • Abstract
    The probability of union events is always important in management science. Many real life applications use such probability in their core implementations. The most popular method to calculate the probability of union events is the Inclusion-Exclusion Principle (IEP), which originates from the idea of Abraham de Moivre (1718). However, the computation complexity is exact O(2n), and no matter what the events are, the complexity order can not be decreased. A much efficient method namely Recursive Inclusion-Exclusion Principle (RIEP) was constructed by rearranging its equation to its recursive form. The computation complexity is also O(2n) in the worse cases, but it usually has 10 times efficiency than IEP in the normal cases. This paper proposed a novel reduction method for the RIEP to calculate the probability of union events, which can obtain over 100 times efficiency than RIEP in normal cases, and in the worse cases, it has at least the same complexity as that of RIEP. Some benchmarks on network reliability applications show that the proposed approach is very efficient.
  • Keywords
    computational complexity; management science; probability; Abraham de Moivre; IEP; computation complexity; management science; network reliability applications; real life applications; reduced recursive inclusion-exclusion principle; reduction method; union event probability; union events; Benchmark testing; Complexity theory; Equations; Mathematical model; Probability; Reliability; Vectors; Inclusion-exclusion principle; minimal path; network reliability; reduction; the probability of union events;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2014 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/IEEM.2014.7058590
  • Filename
    7058590