DocumentCode :
3576609
Title :
Weibull component reliability evaluation with masked data
Author :
Jieqiong Miao ; Xiaogang Li ; Renxi Luo
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear :
2014
Firstpage :
551
Lastpage :
554
Abstract :
Under the condition that the exact component causing system failure is masked in life testing, a new method is proposed to evaluate the reliability of Weibull component in a series system. Considering relaxing the symmetry assumption of masking probability, we obtained the likelihood function of the Weibull components on the basis of the masking probability does not depend on the distribution parameters. A latent variable is introduced to rewrite the form of the likelihood function, and we obtain the estimators of the unknown parameters. The confidence intervals of Weibull component life-distribution parameter are also inferred with likelihood ratio method. The approach is illustrated with a simple numerical example.
Keywords :
Weibull distribution; failure analysis; life testing; maximum likelihood estimation; numerical analysis; reliability theory; Weibull component life-distribution parameter; Weibull component reliability evaluation; confidence intervals; latent variable; life testing; likelihood function; likelihood ratio method; masked data; masking probability; numerical analysis; series system; symmetry assumption; system failure; unknown parameter estimation; Bayes methods; Maximum likelihood estimation; Parameter estimation; Reliability; Silicon; Weibull distribution; Weibull distribution; auxiliary variable; masked data; maximum likelihood estimation; reliability estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2014 IEEE International Conference on
Type :
conf
DOI :
10.1109/IEEM.2014.7058698
Filename :
7058698
Link To Document :
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