Title :
Characterization of highly erbium-doped fibers confocal luminescence microscopy
Author :
Dierolf, V. ; Morgus, T. ; Fleischman, Z. ; Sandmann, Chr. ; Claesson, A. ; Margulis, W.
Author_Institution :
Dept. of Phys., Lehigh Univ., Bethlehem, PA, USA
Abstract :
Using confocal luminescence microscopy and detailed evaluation of the luminescence spectra in terms of intensity, spectral position and width, we determined the erbium doping profiles and their inhomogeneities in high index profile singly mode fibers.
Keywords :
doping profiles; erbium; optical fibre amplifiers; optical fibre testing; optical microscopy; photoluminescence; spectrochemical analysis; visible spectra; confocal luminescence microscopy; erbium doping profiles determination; erbium-doped fibers; index profile inhomogeneity; luminescence spectra; single mode fibers; spectral position; spectral width;
Conference_Titel :
Optical Fiber Communication Conference, 2004. OFC 2004
Print_ISBN :
1-55752-772-5
