One step electrodeposited CZTS thin films: Preparation and characterization

Author

Slimani Tlemcani, T. ; El Moursli, F. Cherkaoui ; Taibi, M. ; Hajji, F. ; Benamar, E.B. ; Colis, S. ; Schmerber, G. ; Muller, D. ; Slaoui, A. ; Dinia, A. ; Abd-Lefdil, M.

Author_Institution

Mater. Phys. Lab., Univ. of Mohammed V, Rabat, Morocco

fYear

2014

Firstpage

89

Lastpage

93

Abstract

Cu₂ZnSnS₄ (CZTS) thin films were successfully prepared using a single-step electrodeposition process in aqueous ionic solution, followed by the sulfurization in elemental sulfur vapor ambient at different annealing temperatures and under Argon atmosphere. The structural, morphological, compositional and optical properties of the samples have been investigated. Raman spectroscopy and X-ray diffraction (XRD) have confirmed the Kesterite structure of CZTS films sulfurized at 500 °C. The chemical composition was determined by Rutherford Back Scattering (RBS) and energy dispersive X-ray spectroscopy (EDS) that show the formation of near stoichiometric CZTS thin films. The surface morphology of the samples was examined using scanning electron microscopy (SEM) and atomic force microscopy (AFM). Optical properties of the CZTS thin film were studied by photoluminescence spectroscopy (PL).

Keywords

Raman spectra; Rutherford backscattering; X-ray chemical analysis; X-ray diffraction; annealing; atomic force microscopy; copper compounds; electrodeposition; photoluminescence; scanning electron microscopy; semiconductor growth; semiconductor materials; semiconductor thin films; stoichiometry; surface morphology; tin compounds; zinc compounds; AFM; CZTS thin film preparation; Cu₂ZnSnS₄; EDS; PL; RBS; Raman spectroscopy; SEM; X-ray diffraction; XRD; annealing temperature; aqueous ionic solution; argon atmosphere; atomic force microscopy; compositional properties; elemental sulfur vapor; energy dispersive X-ray spectroscopy; kesterite structure; morphological properties; optical properties; photoluminescence spectroscopy; rutherford back scattering; scanning electron microscopy; single-step electrodeposition process; stoichiometry; structural properties; sulfurization; surface morphology; temperature 500 degC; Force; Optical films; Optical imaging; Tin; Cu2ZnSnS4; characterization; electrodeposition; sulfurization; thin films;

fLanguage

English

Publisher

ieee

Conference_Titel

Renewable and Sustainable Energy Conference (IRSEC), 2014 International

Print_ISBN

978-1-4799-7335-4

Type

conf

DOI

10.1109/IRSEC.2014.7059867

Filename

7059867